Optics
Description coming soon...
Multilayers
Measurement of reflectance from a depth-graded W/Si multilayer designed and fabricated for HEFT. Typical values for the interface width are 3.5–4 Å for this material combination. This particular sample was characterized up to 40 keV.
Detectors
Spectrum taken with the HEFT 8 × 8 pixel prototype CdZnTe detector coupled to our custom low-noise ASIC readout chip. The detector was cooled to −25 °C.
Spectrum taken with the 8 × 8 pixel HEFT prototype detector.
The detector was at room temperature.
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http://www.srl.caltech.edu/HEFT/results.html